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Updated: Jan 30, 2026

Analysis of Contact Interfaces for Single GaN Nanowire Devices
Published on: November 15, 2013
Contact-free conductivity probing of metal nanowire films using THz reflection spectroscopy
Muriel E Layani-Tzadka1, Daniel Krotkov1, Einat Tirosh1
1School of Chemistry, Raymond and Beverly Sackler Faculty of Exact Sciences and Center for Light-Matter-Interaction, Tel Aviv University 6997801, Israel.
Abstract:
We utilize time-domain Terahertz (THz) reflectivity measurements for characterizing the surface conductivity of Polyethylene-terephthalate coated with nanowire (NW) films to form novel transparent electrodes (TE). We find good correspondence between the film conductivity and the THz-field reflectivity that provide uniquely desirable means for non-destructive, contactless conductivity measurements of large area NW-based-TEs. We demonstrate the robustness of THz reflectivity measurements to deviations invoked on NW film composition and film uniformity. The dependence of THz reflectivity on area NW coverage follows an anisotropic effective medium model for the dielectric constant.
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