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Updated: Jan 30, 2026

Force Spectroscopy of Single Protein Molecules Using an Atomic Force Microscope
Published on: February 28, 2019
The qPlus sensor, a powerful core for the atomic force microscope
1Institute of Experimental and Applied Physics, University of Regensburg, Universitätsstrasse 31, D-93040 Regensburg, Germany.
Atomic force microscopy (AFM) advancements, particularly with the qPlus sensor and frequency modulation AFM (FM-AFM), enable subatomic resolution imaging and force spectroscopy. These techniques offer unprecedented detail in surface science and nanoscience applications.
Area of Science:
- Surface science
- Nanoscience
- Materials science
- Chemistry
- Biology
Background:
- Atomic force microscopy (AFM), developed in 1986, is a versatile tool for imaging and manipulation across various scientific disciplines.
- AFM evolved from scanning tunneling microscopy (STM), replacing the STM tip with a force sensor to measure chemical forces.
- Significant instrumentation progress has been made in AFM, focusing on force sensors, tips, and detection mechanisms.
Purpose of the Study:
- To highlight advancements in AFM force sensors, specifically the qPlus sensor and its self-sensing capabilities.
- To discuss the principles and advantages of Frequency Modulation Atomic Force Microscopy (FM-AFM) for high-resolution imaging and force spectroscopy.
- To explore the applications and limiting factors of these advanced AFM techniques.
Main Methods:
- Utilizing qPlus sensors, which leverage the piezoelectricity of quartz for self-sensing, enabling parallel STM and AFM measurements.
- Employing Frequency Modulation Atomic Force Microscopy (FM-AFM) to detect force gradients by measuring changes in cantilever oscillation frequency.
- Implementing noncontact AFM operation to separate conservative and dissipative forces and achieve high signal-to-noise ratios.
Main Results:
- The qPlus sensor achieves subatomic spatial resolution in AFM, surpassing STM capabilities.
- FM-AFM provides atomic and subatomic resolution, along with force spectroscopy at sub-piconewton sensitivity.
- Simultaneous AFM and STM measurements are feasible with FM-AFM due to its noncontact operation.
Conclusions:
- Advanced AFM techniques, particularly those using qPlus sensors and FM-AFM, offer unprecedented resolution and sensitivity.
- These methods are crucial for detailed studies of atomic interactions, spin-dependent forces, and molecular structures.
- Continued development in AFM instrumentation promises further breakthroughs in nanoscience and surface characterization.
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