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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
M J Rosenberg1, D B Thorn2, N Izumi2
1Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623, USA.
Researchers measured the sensitivity of Fuji image plates (IPs) for X-ray spectrometers. Sensitivity varied by up to 5% with scanner settings, highlighting the need for cross-calibration between facilities.
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