Two-step random phase retrieval approach based on Gram-Schmidt orthonormalization and Lissajous ellipse fitting...

Area of Science:

• Optics and Photonics
• Interferometry
• Image Processing

Background:

• Phase shifting interferometry (PSI) is susceptible to phase shift errors.
• Accurate phase retrieval is crucial for metrology and imaging.
• Existing methods often require multiple interferograms or complex filtering.

Purpose of the Study:

• To develop a robust and efficient phase retrieval method for PSI.
• To overcome the limitations of traditional phase shifting techniques.
• To achieve accurate phase distribution with reduced computational load.

Main Methods:

• A two-step random phase retrieval approach combining Gram-Schmidt (GS) orthonormalization and Lissajous ellipse fitting (LEF).
• The GS&LEF method utilizes only two phase-shifted interferograms.
• No pre-filtering is required, simplifying the process.

Main Results:

• The GS&LEF method achieves relatively accurate phase distribution.
• It demonstrates robustness against varying background intensity, modulation amplitudes, and noise.
• The method is effective for various fringe types, including circular, straight, and complex patterns.

Conclusions:

• The proposed GS&LEF method effectively overcomes phase shift errors in PSI.
• It offers a computationally efficient and versatile solution for phase retrieval.
• Simulations and experiments confirm the correctness and feasibility of the GS&LEF approach.