Aliasing
Outer Layers of the Cell Envelope
Beams
Deflection of a Beam
Phase Diagrams
Phase Transitions
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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
This study demonstrates a novel optical phased array (OPA) capable of generating a uniform beam intensity for optical beam-forming. The fabricated silicon-on-insulator device achieves aliasing-free beam-steering across a wide field-of-view.
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