Nitrogen adsorption data, FIB-SEM tomography and TEM micrographs of neutron-irradiated superfine grain graphite

This manuscript provides raw nitrogen gas adsorption data, images and videos obtained from a technique that combines Focused Ion Beam (FIB) and Scanning Electron Microscopy (SEM) known as FIB-SEM tomography and Transmission Electron Microscopy (TEM) micrographs. This collection of data is useful for characterization of the effects of high fluence neutron irradiation in nuclear graphite as described in the associated manuscript, "Mesopores development in superfine grain graphite neutron-irradiated at high fluence" (Contescu et al., 2019). Nitrogen adsorption isotherms at 77 K are provided for graphite samples before and after neutron irradiation at 300, 450, and 750 °C at fluences before and after turnaround. FIB-SEM tomography reveals porosity of unirradiated and irradiated samples. Using this technique, four data sets were obtained, of which the first three are presented in video format, whereas the fourth one is a series of images provided in raw format unique to this manuscript. All microscopy data document the microstructure, surface area and porosity of superfine grain graphite G347A (Tokai Carbon, Japan) before irradiation and irradiated after turnaround at 400 °C. TEM micrographs provide unique information on irradiation damage at high neutron fluence (>27. 8 displacements per atom, dpa) in the microstructure and crystal lattice of graphite. Additional TEM micrographs are provided here, which do not duplicate the research paper published elsewhere (Contescu et al., 2019). These data sets are unique, as samples at high irradiation doses have never been measured or imaged before with the aforementioned techniques.