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Updated: Jan 29, 2026

Failure Analysis of Batteries Using Synchrotron-based Hard X-ray Microtomography
Published on: August 26, 2015
An X-ray microtomography-based method for detailed analysis of the three-dimensional morphology of fungal pellets
Stefan Schmideder1, Lars Barthel2, Tiaan Friedrich1
1Technical University of Munich, School of Life Sciences Weihenstephan, Chair of Process Systems Engineering, Freising, Germany.
Abstract:
Filamentous fungi are widely used in the production of biotechnological compounds. Since their morphology is strongly linked to productivity, it is a key parameter in industrial biotechnology. However, identifying the morphological properties of filamentous fungi is challenging. Owing to a lack of appropriate methods, the detailed three-dimensional morphology of filamentous pellets remains unexplored. In the present study, we used state-of-the-art X-ray microtomography (µCT) to develop a new method for detailed characterization of fungal pellets. µCT measurements were performed using freeze-dried pellets obtained from submerged cultivations. Three-dimensional images were generated and analyzed to locate and quantify hyphal material, tips, and branches. As a result, morphological properties including hyphal length, tip number, branch number, hyphal growth unit, porosity, and hyphal average diameter were ascertained. To validate the potential of the new method, two fungal pellets were studied-one from Aspergillus niger and the other from Penicillium chrysogenum. We show here that µCT analysis is a promising tool to study the three-dimensional structure of pellet-forming filamentous microorganisms in utmost detail. The knowledge gained can be used to understand and thus optimize pellet structures by means of appropriate process or genetic control in biotechnological applications.
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