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Selected Area Electron Beam Induced Deposition of Pt and W for EBSD Backgrounds
William A Osborn1, Mark J McLean1, Brian Bush1
1Materials Measurement Science Division,National Institute of Standards and Technology,100 Bureau Drive, MS 8520,Gaithersburg, MD,USA.
Abstract:
Applying high-resolution electron backscatter diffraction (HR-EBSD) to materials without regions that are amenable to the acquisition of backgrounds for static flat fielding (background subtraction) can cause analysis problems. To address this difficulty, the efficacy of electron beam induced deposition (EBID) of material as a source for an amorphous background signal is assessed and found to be practical. Using EBID material for EBSD backgrounds allows single crystal and large-grained samples to be analyzed using HR-EBSD for strain and small angle rotation measurement.
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