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Yield Loss in Sweet Corn Caused by Puccinia sorghi: A Meta-Analysis
Denis A Shah1, Helene R Dillard1
1Department of Plant Pathology, New York State Agricultural Experiment Station, 630 W. North St., Geneva 14456.
Abstract:
Data sets meeting established criteria were included in a meta-analysis of the relationship between percent common rust severity and percent relative yield loss in sweet corn (processing: 20 data sets; fresh market: 14 data sets). The slope of the linear, zero intercept relationship was estimated from each data set. Overall slopes and their respective 95% confidence intervals for the processing and fresh market situations were estimated by a random effects meta-analysis. Results indicated that for processing sweet corn, every 10% increase in rust severity reduced yield by 2.4 to 7.0%; the corresponding reduction for fresh market sweet corn was between 3.0 and 6.2%. A meta-regression analysis did not identify any factors that could account for the observed variability between data sets. An expression was then obtained for Δs, the reduction in rust severity a single strobilurin fungicide spray ought to cause for the cost of the treatment to be offset by the value of the resulting yield improvement. The empirical distribution of Δs,was derived by stochastic simulation, which showed that fungicide usage could be cost effective 90% of the time when rust severity is reduced by 12% in processing sweet corn and by 5% in fresh market sweet corn.
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