Interference and Diffraction
Crystal Field Theory - Octahedral Complexes
Ionic Crystal Structures
Ions and Ionic Charges
Preparation of Samples for Electron Microscopy
Formation of Complex Ions
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Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Published on: July 26, 2014
Heng Zhou1, Zhipu Luo1, Xueming Li1
1Key Laboratory of Protein Sciences (Tsinghua University), Ministry of Education, Beijing, China; School of Life Sciences, Tsinghua University, Beijing, China.
Focused ion beam (FIB) milling thins large protein crystals for electron diffraction. This method overcomes limitations of electron crystallography for larger samples, enabling detailed structural analysis.
07:00Preparing Lamellae from Vitreous Biological Samples Using a Dual-Beam Scanning Electron Microscope for Cryo-Electron Tomography
Published on: August 5, 2021
08:20Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
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