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Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Atomic scale characterization of point and extended defects in niobate thin films

Changjian Li1, Dongsheng Song2, Mengsha Li1

  • 1Department of Materials Science and Engineering, National University of Singapore, 117575 Singapore.

Ultramicroscopy
|March 13, 2019
PubMed

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