A low-energy electron point-source projection microscope not using a sharp metal tip performs well in long-range
Evelyne Salançon1, Alain Degiovanni1, Laurent Lapena1
1CINaM, Aix-Marseille Univ, CNRS, UMR 7325, France.
Abstract:
A low-energy electron point-source projection microscope that uses a metal/insulator structure as source instead of a sharp metal needle is presented. By combining this source with an electron optical lens and a high spatial resolution image detector, performances comparable to those of a normal electron projection microscope are easily accessible and presented here. The accessible electron energy range extends from 100 eV to 1000 eV. In the example presented here, instead of the usual near-field source-object distance, long-range imaging at a distance of about 600 µm is achieved.
Related Concept Videos
Sources of Self-Esteem II: Performance Feedback
Alkali Metals
Table 1: Properties of the alkali metals
Bonding in Metals
Properties of Transition Metals
Ionization Energy
Energy Basics


