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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells
Published on: August 20, 2019
Giulio Del Zanna1, Helen E Mason1
1DAMTP, Centre for Mathematical Sciences, University of Cambridge, Wilberforce Road, Cambridge, CB3 0WA UK.
This review explores X-ray and ultraviolet (XUV) spectroscopy for measuring solar plasma parameters. It details methods for analyzing optically thin emission to determine electron densities, temperatures, and abundances in the Sun's outer atmosphere.
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