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Brain Morphometry Methods for Feature Extraction in Random Subspace Ensemble Neural Network Classification of
Roman Vyškovský1, Daniel Schwarz2, Tomáš Kašpárek3
1Masaryk University, Faculty of Medicine, Institute of Biostatistics and Analyses, 625 00, Brno, Czech Republic vyskovsky@iba.muni.cz.
This study introduces a machine learning framework for schizophrenia diagnostics using magnetic resonance imaging (MRI) data. Combining voxel-based (VBM) and deformation-based morphometry (DBM) features improved classification accuracy to 73.12%.
Area of Science:
- Neuroimaging
- Machine Learning
- Psychiatry
Background:
- Schizophrenia diagnosis can be challenging.
- Machine learning (ML) offers potential for developing auxiliary diagnostic tools.
- Neuroimaging data, particularly magnetic resonance imaging (MRI), provides valuable structural information.
Purpose of the Study:
- To present a novel classification framework for schizophrenia diagnostics.
- To evaluate the effectiveness of combining different feature extraction methods from MRI data.
- To assess the performance of a multilayer perceptron (MLP) classifier within this framework.
Main Methods:
- Features were extracted from MRI data using voxel-based morphometry (VBM) and deformation-based morphometry (DBM).
- A random subspace ensemble-based artificial neural network, specifically a multilayer perceptron (MLP), was employed as the classifier.
- The framework was tested on data from first-episode schizophrenia patients and healthy controls.
Main Results:
- Combining VBM and DBM features enhanced MLP classification accuracy to 73.12%.
- This represents a 5% improvement compared to using VBM or DBM features alone.
- Comparisons with support vector machines (SVMs) did not reveal a superior classifier.
Conclusions:
- The integration of diverse morphometric features from MRI significantly improves ML-based schizophrenia classification.
- The proposed framework demonstrates the potential of ML as an auxiliary diagnostic tool in psychiatry.
- Further research is needed to determine the optimal classifier for this application.
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