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Updated: Jan 27, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
Published on: May 23, 2017
Editorial for the Special Issue on Wide Bandgap Semiconductor Based Micro/Nano Devices
1Department of Materials Design and Innovation, University at Buffalo, The State University of New York, Buffalo, NY 14260, USA. junghuns@buffalo.edu.
Abstract:
While conventional group IV or III-V based device technologies have reached their technical limitations (e [...].
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