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Shengyang Liu1, Lei Dong2, Xiaozhong Liao3
1School of Automation, Beijing Institute of Technology, Beijing 100081, China. 3120140375@bit.edu.cn.
This study introduces a new method using normalized voltage, current, and fill factor to accurately diagnose single and compound faults in photovoltaic arrays, even with noisy data. The Gaussian Kernel Fuzzy C-means clustering effectively identifies 8 common fault types.
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