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Updated: Jan 27, 2026

Comprehensive Characterization of Extended Defects in Semiconductor Materials by a Scanning Electron Microscope
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Exploring adaptive optics on focus-scan for nonlinear materials characterization.

Fábio R P Dos Santos1, Denise Valente2, R E de Araujo1

  • 1Laboratory of Biomedical Optics and Imaging, Federal University of Pernambuco, Recife, Brazil.

The Review of Scientific Instruments
|April 1, 2019
PubMed
Summary
This summary is machine-generated.

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This study introduces a novel method using a deformable mirror to analyze nonlinear optical properties without moving the sample. This technique offers an alternative to traditional Z-scan methods for materials that cannot be translated.

Area of Science:

  • Nonlinear optics
  • Laser physics
  • Materials science

Background:

  • The conventional Z-scan technique measures nonlinear optical properties by axially translating a sample through a focused laser beam.
  • This sample translation requirement limits its application for materials that cannot be moved or are integrated into fixed systems.

Purpose of the Study:

  • To develop an alternative to the conventional Z-scan technique.
  • To enable the measurement of nonlinear optical properties in samples that cannot be axially translated.
  • To introduce a method using controllable defocus aberrations to scan the beam focus through the sample.

Main Methods:

  • A deformable mirror was employed to introduce controllable defocus aberrations.
  • The laser beam's focus was translated through the nonlinear sample by adjusting the deformable mirror.

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  • The time-dependent behavior of the transmitted light beam was analyzed at various defocus configurations.
  • The method was validated using reference materials like carbon disulfide (CS2) and silicon dioxide (SiO2).

    • Main Results:

    • The deformable mirror technique successfully generated controllable defocus aberrations, effectively scanning the laser focus through the sample.
    • Measurements of nonlinear refractive index and absorption coefficient were obtained without axial sample displacement.
    • Results obtained using the novel method showed good agreement with those from the conventional Z-scan technique for reference samples.

    Conclusions:

    • The developed technique provides a viable alternative to the conventional Z-scan method, particularly for samples that cannot be translated.
    • This approach expands the applicability of nonlinear optical measurements to a broader range of materials and experimental setups.
    • The use of a deformable mirror offers precise control over beam focusing for accurate material characterization.