[Stress and electrochemical corrosion of titanium produced by laser rapid forming]

Objective: To investigate the stress corrosion and electrochemical corrosion resistance of titanium produced through laser rapid forming (LRF), and to provide a basis for their clinical application. Methods: Forged commercial pure titanium (CP-Ti) was used as control group and LRF pure titanium was used as LRF group. All samples were placed in acidic artificial saliva containing fluorine (pH=7), and loaded with a stress of 1.2 × σ(0.2) Pa (σ(0.2) represents the yield strength of material). Stress corrosion resistance of specimens that have been soaked for 30 days was analyzed by naked eye observation, X-ray diffraction analysis and scanning electron microscopy. For samples placed in artificial saliva, neutral fluoride solution (pH=7) and acidic fluoride solution (pH=3) (4 test pieces in each corrosive medium), and their electrochemical corrosion resistance was evaluated by free corrosion potential (Ecorr) measurements, corrosion current (Icorr), electrochemical impedance spectroscopy (EIS), and anodic polarization curves. Results: With the prolongation of immersion time, the corrosion products gradually increased. The stress corrosion of CP-Ti group was significantly more than that of LRF-Ti group, and the pit diameter was significantly larger than that of LRF-Ti group. The electrochemical corrosion results showed that the Ecorr (-469 mV) of LRF-Ti in artificial saliva was higher than that of CP-Ti (-555 mV), and the Ecorr (-925 mV) of LRF-Ti was higher than that of CP-Ti (-943 mV) in neutral fluoride solution. In acid fluoride solution, the Ecorr (-943 mV) of LRF-Ti was higher than that of CP-Ti (-956 mV). The Ecorr of the same metal was the highest in artificial saliva and the lowest in acid fluoride solution; the Icorr of the same metal was the lowest in artificial saliva and the highest in acid fluoride solution. Conclusions: Under the same corrosion conditions, LRF Ti demonstrated better stress and electrochemical corrosion resistance than CP-Ti.