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Deconvoluting Diffuse Reflectance Spectra for Retrieving Nanostructures' Size Details: An Easy and Efficient

Manushree Tanwar¹, Anjali Chaudhary¹, Devesh K Pathak¹

¹Material Research Laboratory, Discipline of Physics & MEMS , Indian Institute of Technology Indore , Simrol 453552 , India.

The Journal of Physical Chemistry. A

|April 17, 2019

Summary

This summary is machine-generated.

This study introduces a new, cost-effective diffuse reflectance spectroscopy model for estimating nanostructured material size and distribution. The method accurately determines crystallite size and distribution, validated by Raman spectroscopy and electron microscopy.

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Area of Science:

Materials Science
Spectroscopy
Nanotechnology

Background:

Accurate characterization of nanostructured materials is crucial for their applications.
Traditional methods for size and distribution analysis can be complex and expensive.
Diffuse reflectance spectroscopy (DRS) offers a potentially simpler and more economical approach.

Purpose of the Study:

To develop and validate a novel model for estimating mean size and size distribution in nanostructured materials.
To utilize spectral line-shape analysis of diffuse reflectance spectroscopy data.
To provide an accessible method for nanostructure characterization.

Main Methods:

Derivation of a theoretical line-shape function based on size distribution and band gap.
Fitting experimental absorption spectra with the derived line-shape function.
Preparation of silicon nanostructured samples using metal-induced etching.

Main Results:

Successfully estimated mean crystallite size and size distribution from silicon nanostructured samples.
Validated the model's accuracy by comparing results with Raman spectroscopy and electron microscopy.
Demonstrated the model's ability to assess homogeneity in size distribution.

Conclusions:

Diffuse reflectance spectroscopy, through spectral line-shape analysis, provides a simple, economic, and accurate method for estimating nanostructure size and distribution.
The developed model is a valuable tool for nanostructured material characterization and homogeneity assessment.
This technique complements established methods like Raman spectroscopy and electron microscopy.