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Updated: Jan 26, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
Precision and informational limits in inelastic optical spectroscopy
Peter Török1,2, Matthew R Foreman3
1School of Physical and Mathematical Sciences, Nanyang Technological University, Singapore, Singapore.
Abstract:
Using Fisher information and the Cramér-Rao lower bound, we analyse fundamental precision limits in the determination of spectral parameters in inelastic optical scattering. General analytic formulae are derived which account for the instrument response functions of the dispersive element and relay optics found in practical Raman and Brillouin spectrometers. Limiting cases of dispersion and diffraction limited spectrometers, corresponding to measurement of Lorentzian and Voigt lineshapes respectively, are discussed in detail allowing optimal configurations to be identified. Effects of defocus, spherical aberration, detector pixelation and a finite detector size are also considered.
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