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Updated: Jan 26, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging
Yating Zhou1, Rhian Patterson1,2, Benjamin A Palmer1,3
1School of Chemistry , Cardiff University , Park Place , Cardiff CF10 3AT , Wales , UK .
Abstract:
The X-ray Birefringence Imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. We report the first application of the XBI technique to characterize molecular orientational ordering in a liquid crystalline material, demonstrating significant potential for exploiting XBI measurements to advance structural understanding of liquid crystal phases.
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