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Robust Extraction of Hyperbolic Metamaterial Permittivity using Total Internal Reflection Ellipsometry.

Cheng Zhang1,2, Nina Hong3, Chengang Ji4

  • 1Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD, 20899, USA.

ACS Photonics
|April 19, 2019
PubMed
Summary

This study introduces a robust total internal reflection ellipsometry method for accurately characterizing hyperbolic metamaterials. The technique enhances light interaction for improved permittivity tensor extraction without sample modification.

Keywords:
anisotropic metamaterialhyperbolic metamaterialspectroscopic ellipsometrytotal internal reflection ellipsometry

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • Nanotechnology

Background:

  • Hyperbolic metamaterials exhibit unique optical properties due to anisotropic permittivity tensors with opposite signs.
  • Current characterization methods struggle with robust extraction of the complex permittivity tensor for these materials.

Purpose of the Study:

  • To develop and demonstrate an improved ellipsometry technique for accurate permittivity tensor extraction in hyperbolic metamaterials.
  • To enhance the sensitivity and reliability of optical property characterization for anisotropic metamaterials.

Main Methods:

  • Utilizing an ellipsometry technique based on total internal reflection.
  • Enhancing light-matter interaction within metamaterial stacks to improve ellipsometric sensitivity.

Main Results:

  • Demonstrated improved robustness and accuracy in extracting the complex permittivity tensor.
  • Achieved enhanced ellipsometric sensitivity for reliable optical property determination.

Conclusions:

  • The total internal reflection ellipsometry technique offers a reliable and accessible method for characterizing hyperbolic metamaterials.
  • This approach simplifies the characterization process, requiring no sample modification or complex setups, making it broadly applicable to anisotropic metamaterials.