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Sample Preparation by 3D-Correlative Focused Ion Beam Milling for High-Resolution Cryo-Electron Tomography
Published on: October 25, 2021
Arthur France-Lanord1, Jeffrey C Grossman1
1Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA.
We developed a new simulation method for ionic conductivity, treating ion clusters as charge carriers. This approach improves accuracy and lowers computational cost for understanding ion transport in electrolytes.
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