Hydrogen Passivated Silicon Grain Boundaries Greatly Reduce Charge Recombination for Improved Silicon/Perovskite...

By performing nonadiabatic molecular dynamics simulations, we demonstrate that grain boundaries (GBs) can induce the indirect-to-direct transition of the silicon band gap. However, missing a silicon atom creates an electron trap state in the GBs. Electron trapping by the silicon vacancy occurs on tens of picoseconds followed by recombination of the trapped electron and valence band hole on sub-100 ps, which operates parallel to recombination of the free electron and hole on a similar time scale. The recombination is greatly accelerated by 2 orders of magnitude compared to the GBs without a silicon vacancy. Hydrogen passivation eliminates the trap state and notably delays the charge recombination due to an increased band gap and a shortened coherence time, extending the excited-state lifetime to sub-10 ns. Our study provides an atomistic description of how charge recombination in the silicon can be efficiently reduced, suggesting a rational route to enhance silicon/perovskite tandem solar cells performance.