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The Effect of Anodization Parameters on the Aluminum Oxide Dielectric Layer of Thin-Film Transistors
Published on: May 24, 2020
Lynn Lee1, Jeongwoon Hwang2,3, Jin Won Jung1
1Department of Chemistry, Hanyang University, Seoul, 04763, Republic of Korea.
Researchers developed multi-value logic transistors using zinc oxide composite nanolayers. This novel approach enables stable intermediate states for advanced electronic applications.
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