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When one or more data points appear far from the rest of the data, there is a need to determine whether they are outliers and whether they should be eliminated from the data set to ensure an accurate representation of the measured value. In many cases, outliers arise from gross errors (or human errors) and do not accurately reflect the underlying phenomenon. In some cases, however, these apparent outliers reflect true phenomenological differences. In these cases, we can use statistical methods...
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Updated: Jan 25, 2026

A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
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Fast method to detect and calculate displacement errors in a Littrow grating-based interferometer.

Qiang Lv, Zhaowu Liu, Wei Wang

    Applied Optics
    |May 3, 2019
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    Summary
    This summary is machine-generated.

    A new method accurately calculates grating errors in precision displacement measurements. This fast, low-cost technique is crucial for enhancing grating interferometer accuracy.

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    Area of Science:

    • Metrology
    • Optical Engineering
    • Precision Measurement

    Background:

    • Grating-based interferometers are vital for precision displacement measurements.
    • Grating surface and line errors significantly impact measurement accuracy, particularly in Littrow configurations.

    Purpose of the Study:

    • To propose a fast and accurate method for calculating displacement errors in grating-based interferometers with Littrow configurations.
    • To address the impact of grating surface and line errors on measurement accuracy.

    Main Methods:

    • Calculating displacement errors using diffracted wavefronts at the ±1st orders of the grating.
    • Employing a Littrow configuration for the grating-based interferometer.

    Main Results:

    • The proposed method accurately calculates displacement errors caused by grating imperfections.
    • Experimental validation using a laser interferometer shows good agreement, with differences within 40 nm.

    Conclusions:

    • The developed method is accurate, fast, and cost-effective.
    • This technique is significant for error compensation and improving the measurement accuracy of grating-based interferometers.