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Quantitative phase imaging based on simple Michelson-type lateral shearing interferometry with rotational right-angle

Tengfei Sun, Zhuang Zhuo, Wenhao Zhang

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    This study presents a simple Michelson-type lateral shearing interferometer for precise phase measurement of microscopic objects. The innovative design using right-angle prisms offers a compact, low-cost, and portable solution for quantitative phase imaging.

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    Area of Science:

    • Optical Physics
    • Microscopy
    • Interferometry

    Background:

    • Precise phase measurement is crucial for analyzing transparent microscopic objects.
    • Traditional interferometers can be complex and expensive.

    Purpose of the Study:

    • To develop a simple, cost-effective Michelson-type interferometer for quantitative phase measurement.
    • To demonstrate the precise measurement of transparent microscopic objects.

    Main Methods:

    • Modified Michelson interferometer using two right-angle prisms instead of plane mirrors.
    • Lateral shear is introduced by rotating the prisms around their ridges.
    • Quantitative phase measurement is achieved through interferometric analysis.

    Main Results:

    • Successful precise quantitative phase measurement of transparent microscopic objects.
    • Demonstrated practicability of the compact and portable system.
    • The system is characterized by its simple structure and low cost.

    Conclusions:

    • The developed Michelson-type lateral shearing interferometer is a practical and effective tool.
    • The use of right-angle prisms simplifies the setup while maintaining precision.
    • This method offers an accessible approach for quantitative phase imaging in microscopy.