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Updated: Jan 25, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
Published on: January 26, 2016
Data on the annealing of NbTiVZr at 1200 °C with slow cooling rate
C Parkin1, D J M King2, A J Knowles2
1Department of Engineering Physics, University of Wisconsin-Madison, Madison, WI 53715, USA.
Abstract:
The data presented here is complementary to the publication entitled "High temperature, low neutron cross-section high-entropy alloys in the Nb-Ti-V-Zr system" [1]. A homogenization methodology with slower cooling rate (∼2 °C/min) was performed. X-ray diffraction and scanning electron microscopy (backscattered electron and energy dispersive spectroscopy) data pertaining to annealed high-entropy alloy composition NbTiVZr is presented.
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