Direct Radiation Detection by a Semiconductive Metal-Organic Framework.

Area of Science:

• Materials Science
• Nanotechnology
• Solid-State Physics

Background:

• Semiconductive metal-organic frameworks (MOFs) are gaining research attention for electronic applications.
• Current electronic applications of semiconductive MOFs are still in early development stages.

Purpose of the Study:

• To demonstrate the efficacy of a lanthanide-based semiconductive MOF (SCU-12) in converting X-ray photons to electrical current.
• To evaluate the performance of SCU-12 as an X-ray detector.

Main Methods:

• Fabrication of a polycrystalline detection device using the SCU-12 semiconductive MOF.
• Testing the device's response to continuous hard X-ray radiation (80 kVp).
• Quantifying X-ray sensitivity and minimum detectable X-ray dose rate.

Main Results:

• The SCU-12 based detector effectively converted X-ray photons into electrical current signals.
• Achieved an X-ray sensitivity of 23.8 μC Gyair⁻¹ cm⁻², comparable to amorphous selenium detectors.
• Established a record low detectable X-ray dose rate of 0.705 μGy s⁻¹ for polycrystalline detectors.

Conclusions:

• This study presents the first successful demonstration of hard X-ray detection using semiconductive MOFs.
• SCU-12 offers a promising new material for radiation detection applications.
• The designability and tunability of MOFs open new avenues for next-generation radiation detection materials.