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Related Concept Videos

Ions as Acids and Bases02:54

Ions as Acids and Bases

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Salts with Acidic Ions
Salts are ionic compounds composed of cations and anions, either of which may be capable of undergoing an acid or base ionization reaction with water. Aqueous salt solutions, therefore, may be acidic, basic, or neutral, depending on the relative acid-base strengths of the salt’s constituent ions. For example, dissolving the ammonium chloride in water results in its dissociation, as described by the equation:
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Beams

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Beams are integral components of structural engineering and construction, designed to support loads applied at various points along their length. These long, straight members can be classified based on geometry, cross-section, support type, and equilibrium condition.
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A type of Lewis acid-base chemistry involves the formation of a complex ion (or a coordination complex) comprising a central atom, typically a transition metal cation, surrounded by ions or molecules called ligands. These ligands can be neutral molecules like H2O or NH3, or ions such as CN− or OH−. Often, the ligands act as Lewis bases, donating a pair of electrons to the central atom. These types of Lewis acid-base reactions are examples of a broad subdiscipline called coordination...
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The movement of ions like sodium, potassium, and calcium into and out of the cell is essential to maintain the electrochemical gradient in living cells. The ion channels—a class of membrane transport proteins—help maintain this ionic gradient for the smooth functioning of physiological activities such as maintaining cell size and volume, conducting nerve impulses, and gas and nutrient exchange.
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Ion Beam Induced Artifacts in Lead-Based Chalcogenides.

Xiaomi Zhang1, Shiqiang Hao1, Gangjian Tan2

  • 1Department of Materials Science and Engineering,Northwestern University,Evanston, IL 60208,USA.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
|May 16, 2019
PubMed
Summary

Argon ion milling damages metal chalcogenide TEM samples, creating artifact clusters. Low-energy cleaning or annealing reveals the true microstructure, crucial for lead chalcogenide research.

Keywords:
aberration-corrected STEMbeam effectsdamageion irradiationsample prepthermoelectric materials

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Area of Science:

  • Materials Science
  • Solid State Physics
  • Nanotechnology

Background:

  • Metal chalcogenides exhibit diverse applications, with properties heavily influenced by microstructure.
  • Investigating structure-property-performance relationships at the atomic scale requires advanced microscopy techniques like scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM).
  • Accurate microstructural analysis is critically dependent on meticulous specimen preparation.

Purpose of the Study:

  • To evaluate the impact of various TEM specimen preparation methods on lead telluride (PbTe) microstructure.
  • To identify and characterize surface irradiation damage induced by argon (Ar) ion milling.
  • To establish reliable protocols for preparing lead chalcogenide TEM specimens.

Main Methods:

  • Comparison of multiple established TEM specimen preparation techniques for stoichiometric PbTe.
  • Aberration-corrected STEM and first-principles calculations to analyze microstructural damage.
  • Investigating the effects of low-energy Ar ion cleaning and high-temperature annealing.

Main Results:

  • Argon ion milling induces surface irradiation damage, forming lead (Pb) vacancy clusters and self-interstitial atom (SIA) clusters.
  • SIA clusters manifest as orthogonal nanoscale features in rock salt structured PbTe, complicating intrinsic microstructure interpretation.
  • Low-energy Ar ion cleaning (300 eV) and high-temperature annealing effectively reduce surface damage and orthogonal features.

Conclusions:

  • Argon ion milling introduces artifacts that obscure the intrinsic microstructure of lead chalcogenides.
  • Optimized low-energy Ar ion cleaning or annealing protocols are essential for accurate TEM analysis of lead-based chalcogenides.
  • The proposed methods can serve as a standard protocol for future TEM specimen preparation in this material class.