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Updated: Jan 24, 2026

Hyperpolarized Xenon for NMR and MRI Applications
Published on: September 6, 2012
Polarized angular-dependent reflectivity and density-dependent profiles of shock-compressed xenon plasmas
Y Zaporozhets1, V Mintsev1, V Fortov1
1Institute of Problems of Chemical Physics, Chernogolovka, Moscow Reg., 142432 Russia.
Abstract:
New data for the reflectivity of shock-compressed xenon plasmas at pressures of 10-12 GPa at large incident angles are presented. In addition, measurements have been performed at different densities. These data allow to analyze the free-electron density profile across the shock wave front. Assuming a Fermi-like density profile, the width of the front layer is inferred. The reflectivity coefficients for the s- and p-polarized waves are calculated. The influence of atoms, which was taken into account on the level of the collision frequency, proves to be essential for the understanding of the reflection process. Subsequently, a unique density profile is sufficient to obtain good agreement with the experimental data at different incident angles and at all investigated optical laser frequencies. Reflectivity measurements for different densities allow to determine the dependence of shock-front density profiles on the plasma parameters. As a result, it was found that the width of the front layer increases with decreasing density.
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