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Published on: November 21, 2019
Magneto-Impedance Sensor Driven by 400 MHz Logarithmic Amplifier.
1Industrial Technology Institute, Miyagi Prefectural Government, Sendai 981-3206, Japan. nakai-to693@pref.miyagi.lg.jp.
This study introduces a highly sensitive thin-film magneto-impedance (MI) sensor for detecting foreign materials in products. A novel logarithmic amplifier circuit enables efficient high-frequency signal detection, advancing smart manufacturing inspection capabilities.
Area of Science:
- Materials Science
- Electrical Engineering
- Sensor Technology
Background:
- Thin-film magnetic field sensors offer non-destructive detection of foreign matter and nanoparticles in industrial and medical products.
- High sensitivity is crucial for smart manufacturing systems requiring comprehensive inspection.
- Existing methods for driving high-frequency magneto-impedance (MI) sensors necessitate specialized circuits.
Purpose of the Study:
- To propose a novel logarithmic amplifier for detecting the 400 MHz output signal of a thin-film MI sensor.
- To demonstrate a simple and effective sensor driving circuit for high-frequency MI sensors.
- To enhance the feasibility of using MI sensors for comprehensive product inspection in smart manufacturing.
Main Methods:
- Design and implementation of a compact, integrated circuit (IC) logarithmic amplifier.
- Integration of the logarithmic amplifier with a chip Voltage Controlled Oscillator (VCO) and an MI sensor.
- Characterization of the sensor's performance at approximately 500 MHz.
Main Results:
- The proposed logarithmic amplifier effectively translates hundreds of MHz radio frequency (RF) signals to a proportional direct current (DC) voltage.
- The amplifier is a small IC-chip (approx. 5 mm x 5 mm), suitable for integration into compact devices.
- A simple sensor driving circuit was composed using the chip VCO, MI sensor, and logarithmic amplifier.
Conclusions:
- The developed logarithmic amplifier is a key component for enabling high-frequency MI sensor applications.
- The proposed circuit configuration simplifies the driving of sensitive MI sensors.
- This technology presents a promising candidate for advanced non-destructive inspection in smart manufacturing environments.
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