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Remote Tracking of Phase Changes in Cr2AlC Thin Films by In-situ Resistivity Measurements

Bastian Stelzer1, Xiang Chen2, Pascal Bliem2

  • 1Materials Chemistry, RWTH Aachen University, D-52074, Aachen, Germany. stelzer@mch.rwth-aachen.de.

Scientific Reports
|June 6, 2019
PubMed

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