Registration uncertainty quantification via low-dimensional characterization of geometric deformations

Jian Wang1, William M Wells2, Polina Golland3

  • 1Computer Science and Engineering, Washington University in St. Louis, MO, United States of America.

Summary

This study introduces an efficient Bayesian framework for quantifying image registration uncertainty. Our method significantly speeds up computations for medical imaging analysis, offering comparable accuracy to existing techniques.

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