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Updated: Jan 22, 2026

Atomically Traceable Nanostructure Fabrication
Published on: July 17, 2015
Zhen Guo1, Xianjiang Li1, Hongmei Li1
1National Institute of Metrology, Division of Metrology in Chemistry, No. 18 East Road of North Third Ring, Chaoyang District, Beijing 100029, China.
Metrological traceability is crucial for recognizing measurement results globally. This study analyzes factors like analytical methods and reference materials to ensure accuracy, aiming for "one measurement, global recognition."
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