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Updated: Jan 22, 2026

Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Scanned conical illumination as a probe of electro-optic retro-reflection
Abstract:
We describe a prototype element for use in probing electro-optic retro-reflection in sensor applications, illuminating a planar-aligned nematic liquid crystal electro-optic cell with convergent light having a single, tunable angle of incidence (tunable conical illumination). This illumination is generated using a 100X, high numerical aperture, long working-distance microscope objective under conditions of extreme spherical aberration. The electro-optic effect observed is multiple-beam optical interference between polarized reflections from the two bounding plates of the cell, rendered tunable with voltage-controlled refractive index changes induced by molecular reorientation of the liquid crystal. Characterization of the reflectivity vs. angle of incidence and applied voltage enables identification of conditions of high-contrast, low power, electro-optic reflectivity control applicable to fiber optics.
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