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Updated: Jan 22, 2026

Non-invasive 3D-Visualization with Sub-micron Resolution Using Synchrotron-X-ray-tomography
Published on: May 27, 2008
A DuMond-type crystal spectrometer for synchrotron-based X-ray emission studies in the energy range of 15-26 keV
P Jagodziński1, J Szlachetko2, J-Cl Dousse3
1Swiss Light Source, Paul Scherrer Institute (PSI), CH-5232 Villigen, Switzerland.
Abstract:
The design and performance of a high-resolution transmission-type X-ray spectrometer for use in the 15-26 keV energy range at synchrotron light sources is reported. Monte Carlo X-ray-tracing simulations were performed to optimize the performance of the transmission-type spectrometer, based on the DuMond geometry, for use at the Super X-ray absorption beamline of the Swiss Light Source at the Paul Scherrer Institute. This spectrometer provides an instrumental energy resolution of 3.5 eV for X-ray emission lines around 16 keV and 12.5 eV for emission lines at 26 keV, which is comparable to the natural linewidths of the K and L X-ray transitions in the covered energy range. First experimental data are presented and compared with results of the Monte Carlo X-ray simulations.
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