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Transmission Electron Microscopy01:15

Transmission Electron Microscopy

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In 1931, physicist Ernst Ruska—building on the idea that magnetic fields can direct an electron beam just as lenses can direct a beam of light in an optical microscope—developed the first prototype of the electron microscope. This development led to the development of the field of electron microscopy. In the transmission electron microscope (TEM), electrons are produced by a hot tungsten element and accelerated by a potential difference in an electron gun, which gives them up to 400...
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Scanning Electron Microscopy01:07

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A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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Electronic Structure of Atoms02:28

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An atom comprises protons and neutrons, which are contained inside the dense, central core called the nucleus, with electrons present around the nucleus. Taking into account the wave–particle duality of electrons and the uncertainty in position around the nucleus, quantum mechanics provides a more accurate model for the atomic structure. It describes atomic orbitals as the regions around the nucleus where electrons of discrete energy exist, characterized by four quantum...
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Wood's structural properties derive from fibers aligned along the tree's length, contributing significantly to its mechanical strength. Wood exhibits up to twenty times greater tensile strength along these fibers compared to across them, and generally shows better performance under compression than tension. The length of fibers varies, with hardwoods having fibers around one twenty-fifth inch long and softwoods ranging from one-eighth to one-third inch.
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Overview of Electron Microscopy01:25

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The wavelengths of visible light ultimately limit the maximum theoretical resolution of images created by light microscopes. Most light microscopes can only magnify 1000X, and a few can magnify up to 1500X. Electrons, like electromagnetic radiation, can behave like waves, but with wavelengths of 0.005 nm, they produce significantly greater resolution up to 0.05 nm as compared to 500 nm for visible light. An electron microscope (EM) can create a sharp image that is magnified up to 2,000,000X.
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Revealing Dynamic Processes of Materials in Liquids Using Liquid Cell Transmission Electron Microscopy
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Material structure, properties, and dynamics through scanning transmission electron microscopy.

Stephen J Pennycook1, Changjian Li1, Mengsha Li1

  • 11Department of Materials Science and Engineering, National University of Singapore, Block EA 07-14, 9 Engineering Drive 1, Singapore, 117575 Singapore.

Journal of Analytical Science and Technology
|July 2, 2019
PubMed
Summary
This summary is machine-generated.

Aberration-corrected scanning transmission electron microscopy (STEM) now enables atomic-level imaging and analysis. This technique minimizes material damage and provides unprecedented insights into material properties at the atomic scale.

Keywords:
Electron energy loss spectroscopyEnergy loss near-edge fine structureEnergy-dispersive X-ray spectroscopyFerroelectric domain structuresLead-free piezoelectricsNanofabricationPoint defect dynamicsScanning transmission electron microscopy

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Area of Science:

  • Materials Science
  • Physics
  • Chemistry

Background:

  • Scanning transmission electron microscopy (STEM) has seen significant advancements.
  • Aberration correction in the probe-forming lens is a key development.

Purpose of the Study:

  • To highlight the capabilities of modern aberration-corrected STEM.
  • To showcase its applications in atomic-level material analysis.

Main Methods:

  • Utilizing aberration-corrected probes with atomic-sized beams.
  • Employing low accelerating voltages (e.g., 40 kV) to minimize knock-on damage.
  • Simultaneous multi-modal imaging and analysis (e.g., EDX, EELS).

Main Results:

  • Routine achievement of atomic-sized beams, even at low voltages.
  • High-quality imaging and analysis with sufficient probe current.
  • Picometer precision mapping of atomic positions and ferroelectric domains.
  • Detailed elemental composition mapping using EDX and EELS.
  • Unit-cell-by-unit-cell tracking of charge transfer via EELS fine structure.
  • Investigation of point defect dynamics through rapid image acquisition.

Conclusions:

  • Modern STEM is an indispensable tool for atomic-level analytical science.
  • It offers novel insights into the structure-property relationships of materials.
  • Enables a deeper understanding of complex interplays controlling material properties.