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A New Analytic Formula for Minority Carrier Decay Length Extraction from Scanning Photocurrent Profiles in

Cheng-Hao Chu1, Ming-Hua Mao2,3,4, Che-Wei Yang1

  • 1Graduate Institute of Electronics Engineering, National Taiwan University, No. 1, Roosevelt Rd. Sec. 4, Taipei, 10617, Taiwan.

Scientific Reports
|July 3, 2019
PubMed

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