No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture

Hui Wang1, Xiaojuan Hu2, Hui Xu3

  • 1School of Information and Control Engineering, China University of Mining and Technology, Xuzhou, China.

Scanning
|July 9, 2019
PubMed
Summary

This study introduces an automated method to assess micrograph blurriness in scanning electron microscopy (SEM). The new technique objectively identifies high-quality images, saving time and effort compared to manual selection.

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