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Composition determination for quaternary III-V semiconductors by aberration-corrected STEM

P Kükelhan1, T Hepp1, S Firoozabadi1

  • 1Materials Science Centre and Faculty of Physics, Philipps University Marburg, Hans-Meerwein-Straße 6, Marburg, Germany.

Ultramicroscopy
|July 17, 2019
PubMed

Keywords:
Composition determinationImage simulationQuantitative STEMQuaternary III-V semiconductors

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