Jove
Visualize
Contact Us

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

4.4K
Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...
4.4K
Electrical Conductivity01:13

Electrical Conductivity

1.7K
In perfect conductors, the electric field inside is always zero due to the abundance of free electrons, which nullify any field by flowing. As a result, any residual charge resides on the surface.
In a practical conductor, an applied electric field may be sustained, causing a flow of electrons, which produce a current. The differential form of the current, the current density, is related to the electric field.
More generally, it is related to the force per unit charge, which involves the...
1.7K
Electric Field of Parallel Conducting Plates01:16

Electric Field of Parallel Conducting Plates

1.6K
Gauss' law relates the electric flux through a closed surface to the net charge enclosed by that surface. Gauss's law can be applied to find the electric field and the charge enclosed in a region depending on its charge distribution.
Consider a cross-section of a thin, infinite conducting plate having a positive charge. For such a large thin plate, as the thickness of the plate tends to zero, the positive charges lie on the plate's two large faces. Without an external electric field, the...
1.6K
Comparison Between Electrical And Gravitational Forces01:24

Comparison Between Electrical And Gravitational Forces

4.0K
There are four fundamental forces in nature: the gravitational force, the electromagnetic force, the strong nuclear force, and the weak nuclear force. To compare the numerical strengths of the first two, take two particles of the same kind. Since electrons are fundamental particles, they are a good example.
Since both are inverse square law forces, the distance gets canceled when the ratio of the two forces is considered. Instead, the ratio of the electrical and gravitational forces depends on...
4.0K
Mutation, Gene Flow, and Genetic Drift01:09

Mutation, Gene Flow, and Genetic Drift

62.9K
In a population that is not at Hardy-Weinberg equilibrium, the frequency of alleles changes over time. Therefore, any deviations from the five conditions of Hardy-Weinberg equilibrium can alter the genetic variation of a given population. Conditions that change the genetic variability of a population include mutations, natural selection, non-random mating, gene flow, and genetic drift (small population size).
62.9K
Atomic Orbitals02:44

Atomic Orbitals

43.3K
An atomic orbital represents the three-dimensional regions in an atom where an electron has the highest probability to reside. The radial distribution function indicates the total probability of finding an electron within the thin shell at a distance r from the nucleus. The atomic orbitals have distinct shapes which are determined by l, the angular momentum quantum number. The orbitals are often drawn with a boundary surface, enclosing densest regions of the cloud.
43.3K

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same journal

Environment-enabled fault diagnosis system for photovoltaic power stations.

The Review of scientific instruments·2026
Same journal

Fast and compact scatterometer for ex vivo qualification of low-scattering biological samples.

The Review of scientific instruments·2026
Same journal

Optimization of a compact electron beam ion trap/source for the generation of low-Z highly charged ions.

The Review of scientific instruments·2026
Same journal

Split-cylinder resonator operating in TE01p modes for determining the complex permittivity of dielectric sheets in the microwave band.

The Review of scientific instruments·2026
Same journal

Influence of secondary fragments on energy spectrum measurements using a CR-39 stack detector in laser-driven heavy ion acceleration.

The Review of scientific instruments·2026
Same journal

A gated alpha-particle time-of-flight spectrometer for laser-driven proton-boron fusion reactions.

The Review of scientific instruments·2026
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jan 21, 2026

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

15.4K

The interplay between drift and electrical measurement in conduction atomic force microscopy.

A Ranjan1, K L Pey1, S J O'Shea2

  • 1Engineering Product Development, Singapore University of Technology and Design, 8 Somapah Road, Singapore 487372.

The Review of Scientific Instruments
|August 3, 2019
PubMed
Summary

To improve Conduction Atomic Force Microscopy (CAFM) measurements, researchers found that using AFM cantilevers with low lateral spring constants helps the tip stay in place longer. This reduces errors caused by thermal drift during electrical monitoring.

More Related Videos

Measuring the Stiffness of Ex Vivo Mouse Aortas Using Atomic Force Microscopy
10:35

Measuring the Stiffness of Ex Vivo Mouse Aortas Using Atomic Force Microscopy

Published on: October 19, 2016

11.1K
Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy
08:41

Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy

Published on: June 27, 2013

41.1K

Related Experiment Videos

Last Updated: Jan 21, 2026

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers
10:15

Atomic Force Microscopy Imaging and Force Spectroscopy of Supported Lipid Bilayers

Published on: July 22, 2015

15.4K
Measuring the Stiffness of Ex Vivo Mouse Aortas Using Atomic Force Microscopy
10:35

Measuring the Stiffness of Ex Vivo Mouse Aortas Using Atomic Force Microscopy

Published on: October 19, 2016

11.1K
Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy
08:41

Measuring the Mechanical Properties of Living Cells Using Atomic Force Microscopy

Published on: June 27, 2013

41.1K

Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Conduction Atomic Force Microscopy (CAFM) is crucial for localized electrical characterization.
  • Thermal drift in CAFM systems causes tip displacement, limiting long-term, single-point measurements.
  • Accurate electrical data collection is hindered by tip movement relative to the sample surface.

Purpose of the Study:

  • To investigate a method for extending tip dwell time at a specific location in CAFM.
  • To mitigate the impact of thermal drift on high-resolution electrical measurements.
  • To enhance the reliability of time-dependent CAFM data acquisition.

Main Methods:

  • Utilizing Atomic Force Microscopy (AFM) cantilevers with low lateral spring constants.
  • Experimentally demonstrating the effect with platinum and diamond-coated tips on SiO2 and HfO2 dielectric films.
  • Simultaneously measuring electrical current and lateral force signals to detect tip-sample interactions.

Main Results:

  • Tip slipping onset correlates with a decrease in measured current flow.
  • Soft lateral spring constants and blunt tips prolong the period before tip slipping occurs.
  • Reduced lateral forces and increased friction effectively increase tip stability.

Conclusions:

  • Employing AFM cantilevers with soft lateral spring constants significantly improves tip stability in CAFM.
  • This method enhances the feasibility of long-duration, single-location electrical measurements.
  • The findings aid in interpreting CAFM data and understanding drift-induced artifacts.