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The interplay between drift and electrical measurement in conduction atomic force microscopy.

A Ranjan1, K L Pey1, S J O'Shea2

  • 1Engineering Product Development, Singapore University of Technology and Design, 8 Somapah Road, Singapore 487372.

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To improve Conduction Atomic Force Microscopy (CAFM) measurements, researchers found that using AFM cantilevers with low lateral spring constants helps the tip stay in place longer. This reduces errors caused by thermal drift during electrical monitoring.

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Area of Science:

  • Materials Science
  • Surface Science
  • Nanotechnology

Background:

  • Conduction Atomic Force Microscopy (CAFM) is crucial for localized electrical characterization.
  • Thermal drift in CAFM systems causes tip displacement, limiting long-term, single-point measurements.
  • Accurate electrical data collection is hindered by tip movement relative to the sample surface.

Purpose of the Study:

  • To investigate a method for extending tip dwell time at a specific location in CAFM.
  • To mitigate the impact of thermal drift on high-resolution electrical measurements.
  • To enhance the reliability of time-dependent CAFM data acquisition.

Main Methods:

  • Utilizing Atomic Force Microscopy (AFM) cantilevers with low lateral spring constants.
  • Experimentally demonstrating the effect with platinum and diamond-coated tips on SiO2 and HfO2 dielectric films.
  • Simultaneously measuring electrical current and lateral force signals to detect tip-sample interactions.

Main Results:

  • Tip slipping onset correlates with a decrease in measured current flow.
  • Soft lateral spring constants and blunt tips prolong the period before tip slipping occurs.
  • Reduced lateral forces and increased friction effectively increase tip stability.

Conclusions:

  • Employing AFM cantilevers with soft lateral spring constants significantly improves tip stability in CAFM.
  • This method enhances the feasibility of long-duration, single-location electrical measurements.
  • The findings aid in interpreting CAFM data and understanding drift-induced artifacts.