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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry
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3D Depth Profile Reconstruction of Segregated Impurities Using Secondary Ion Mass Spectrometry

Published on: April 29, 2020

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Depth resolved defect characterization of energetic ion irradiated ZnO by positron annihilation techniques and

A Sarkar1, M Chakrabarti2, D Sanyal3

  • 1Department of Physics, Bangabasi Morning College, 19 Rajkumar Chakraborty Sarani, Kolkata 700 009, India.

Journal of Physics. Condensed Matter : an Institute of Physics Journal
|August 31, 2019
PubMed

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