Detecting Crystallographic Lattice Chirality using Resonant Inelastic X-ray Scattering

Area of Science:

• Condensed Matter Physics
• Materials Science
• Crystallography

Background:

• Crystallographic chirality is a significant challenge in materials science.
• Current X-ray diffraction methods for characterizing lattice chirality are limited.
• Chirality has broad implications, including in magnetic systems.

Purpose of the Study:

• To theoretically demonstrate the feasibility of indirect K-edge bimagnon resonant inelastic X-ray scattering (RIXS) for distinguishing crystallographic handedness.
• To introduce a modified Flack parameter incorporating RIXS response for chiral identification.

Main Methods:

• Theoretical calculations using spin wave theory.
• Simulation of indirect K-edge bimagnon resonant inelastic X-ray scattering (RIXS) spectra.
• Application to the chalcogenide RbFeSe under realistic experimental conditions.

Main Results:

• The computed RIXS spectrum is sensitive to the lattice's handedness (right or left).
• RIXS response originates from inter- and intra-band scattering processes in the multiband magnon system.
• Extinction or survival of RIXS peaks allows identification of chiral lattice orientations.

Conclusions:

• Indirect K-edge bimagnon RIXS is a viable technique for identifying crystallographic handedness.
• The proposed Flack parameter definition aids in chiral material characterization.
• RIXS spectroscopy offers a novel approach to probe and distinguish chiral structures in materials.