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Reflection; Refraction; Snell's Law and Total Internal Reflection
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X-ray reflecto-interferometer based on compound refractive lenses.

S Lyatun1, D Zverev1, P Ershov1

  • 1Immanuel Kant Baltic Federal University, 14 Nevskogo, 236041 Kaliningrad, Russian Federation.

Journal of Synchrotron Radiation
|September 7, 2019
PubMed
Summary
This summary is machine-generated.

This study introduces a novel X-ray reflecto-interferometer using compound refractive lenses. This device offers high spatial and temporal resolution for analyzing material reflections.

Keywords:
X-ray interferometrycompound refractive lensesinterferogramsreflecto-interferometersspatial resolutiontemporal resolution

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Area of Science:

  • Optics and Photonics
  • Materials Science
  • X-ray Physics

Background:

  • Traditional X-ray interferometers can be complex.
  • A simplified reflection-mode interferometer is needed for advanced material analysis.

Purpose of the Study:

  • To propose and realize a novel X-ray amplitude-splitting interferometer operating in reflection mode.
  • To demonstrate its capability for high-resolution analysis of material surfaces.

Main Methods:

  • Development of an X-ray interferometer utilizing compound refractive lenses.
  • Experimental testing at the European Synchrotron Radiation Facility (ESRF) ID06 beamline.
  • Analysis of X-ray reflections from Si3N4, gold, and resist layers in the 10-15 keV range.

Main Results:

  • Successful realization of the reflecto-interferometer.
  • Demonstration of high spatial and temporal resolution.
  • Experimental interferograms showed good agreement with simulations.

Conclusions:

  • The proposed reflecto-interferometer is a simplified yet powerful tool for X-ray analysis.
  • It offers significant advantages for studying material properties with high resolution.
  • Potential applications include advanced materials characterization and device analysis.