Related Experiment Video
Updated: Jan 19, 2026
Focused Ion Beams FIB-SEM: Milling and Imaging
Published on: April 30, 2023
Precise local control of liquid crystal pretilt on polymer layers by focused ion beam nanopatterning
Maxim V Gorkunov1,2, Irina V Kasyanova1, Vladimir V Artemov1
1Shubnikov Institute of Crystallography, FSRC "Crystallography and Photonics", Russian Academy of Sciences, 119333 Moscow, Russia.
Abstract:
Background: The alignment of liquid crystals by surfaces is crucial for applications. It determines the director configuration in the bulk, its stability against defects and electro-optical switching scenarios. The conventional planar alignment of rubbed polymer layers can be locally flipped to vertical by irradiation with a focused ion beam on a scale of tens of nanometers. Results: We propose a digital method to precisely steer the liquid crystal director tilt at polymer surfaces by combining micrometer-size areas treated with focused ion beam and pristine areas. The liquid crystal tends to average the competing vertical and planar alignment actions and is stabilized with an intermediate pretilt angle determined by the local pattern duty factor. In particular, we create micrometer-sized periodic stripe patterns with this factor gradually varying from 0 to 1. Our optical studies confirm a predictable alignment of a nematic liquid crystal with the pretilt angle continuously changing from 0° to 90°. A one-constant model neglecting the difference between the elastic moduli reproduces the results quantitatively correctly. Conclusion: The possibility of nanofabrication of polymer substrates supporting an arbitrary (from planar to vertical) spatially inhomogeneous liquid crystal alignment opens up prospects of "imprinting" electrically tunable versatile metasurfaces constituting lenses, prisms and q-plates.
More Related Videos
Related Concept Videos
Focused Ion Beams
As electron microscopes become more complex and widely used in research labs, it becomes more of a necessity to introduce their capabilities. Focused ion beam (FIB) is an instrument that can be employed in order to fabricate, trim, analyze and characterize materials on mico- and nano-scales in a wide variety of fields from nano-electronics to medicine. FIB...
08:12Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
10:54Cryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
13:49Focused Ion Beam Lithography to Etch Nano-architectures into Microelectrodes
11:03Nanoscale Characterization of Liquid-Solid Interfaces by Coupling Cryo-Focused Ion Beam Milling with Scanning Electron Microscopy and Spectroscopy
14:46Dendrimer-based Uneven Nanopatterns to Locally Control Surface Adhesiveness: A Method to Direct Chondrogenic Differentiation

