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Related Concept Videos

X-ray Diffraction09:31

X-ray Diffraction

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Source: Faisal Alamgir, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA
X-ray diffraction (XRD) is a technique used in materials science for determining the atomic and molecular structure of a material. This is done by irradiating a sample of the material with incident X-rays and then measuring the intensities and scattering angles of the X-rays that are scattered by the material. The intensity of the scattered X-rays are plotted as a function of the...
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Single Crystal and Powder X-ray Diffraction08:14

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Source: Tamara M. Powers, Department of Chemistry, Texas A&M University 
X-ray crystallography is a technique that uses X-rays to study the structure of molecules. X-ray diffraction (XRD) experiments are routinely carried out with either single-crystal or powdered samples.
Single-crystal XRD:
Single-crystal XRD allows for absolute structure determination. With single-crystal XRD data, the exact atomic positions can be observed, and thus bond lengths and angles can be determined. This...
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Growing Crystals for X-ray Diffraction Analysis08:00

Growing Crystals for X-ray Diffraction Analysis

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Source: Laboratory of Dr. Jimmy Franco - Merrimack College
X-ray crystallography is a method commonly used to determine the spatial arrangement of atoms in a crystalline solid, which allows for the determination of the three-dimensional shape of a molecule or complex. Determining the three-dimensional structure of a compound is of particular importance, since a compound's structure and function are intimately related. Information about a compound's structure is often used to explain its...
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray...
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Tree Core Analysis with X-ray Computed Tomography06:56

Tree Core Analysis with X-ray Computed Tomography

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Here we show how to process tree cores with an X-ray computed tomography toolchain. Except for chemical extraction for some purposes, no further physical lab treatment is needed. The toolchain can be used for biomass estimations, for obtaining MXD/tree-ring width data as well as for obtaining quantitative wood anatomy data.
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X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells10:16

X-ray Beam Induced Current Measurements for Multi-Modal X-ray Microscopy of Solar Cells

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A setup for X-ray beam induced current measurements at synchrotron beamlines is described. It unveils the nanoscale performance of solar cells and extends the suite of techniques for multi-modal X-ray microscopy. From wiring to signal-to-noise optimization, it is shown how to perform state-of-the-art XBIC measurements at a hard X-ray...
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Updated: Jan 19, 2026

X-Ray Diffraction for Determining Atomic and Molecular Structure
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X-Ray Diffraction for Determining Atomic and Molecular Structure

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Combined X-ray diffraction and absorption tomography using a conical shell beam.

A Shevchuk, J P O Evans, A J Dicken

    Optics Express
    |September 13, 2019
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel X-ray tomography technique combining diffraction and absorption for material phase identification. The method achieves high resolution, enabling detailed characterization for applications like security screening and process control.

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    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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    Area of Science:

    • Materials Science
    • Imaging Physics
    • Analytical Chemistry

    Background:

    • Accurate material characterization is crucial for security, industrial process control, and biological imaging.
    • Existing X-ray techniques often provide limited information on material composition and structure.
    • Simultaneous measurement of absorption and diffraction offers a path to enhanced material identification.

    Purpose of the Study:

    • To develop and demonstrate a novel combined diffraction and absorption tomography technique.
    • To achieve simultaneous measurement of absorption contrast and diffracted flux.
    • To enable material phase identification and color-coding within 3D reconstructed volumes.

    Main Methods:

    • Raster scanning of samples through a hollow cone of pseudo-monochromatic X-rays (58.4 keV).
    • Simultaneous acquisition of absorption contrast and diffracted flux using a single image intensifier (90x90 snapshots).
    • Tomosynthesis reconstruction of diffracted flux for d-spacing calculation.

    Main Results:

    • Proof-of-principle demonstrated using a heterogeneous phantom (copper and sodium chlorate).
    • Axial resolution of ~1 mm (x,y) and ~7 mm (z).
    • Accurate d-spacing calculation (~0.1 Å FWHM at ~2 Å) enabling material identification.
    • Color-coding of identified materials within absorption optical sections.

    Conclusions:

    • The combined diffraction and absorption tomography technique is effective for simultaneous material characterization.
    • The method provides high-resolution 3D imaging with material-specific information.
    • Potential applications include security screening (narcotics, explosives), process control, and biological imaging.