Multi-beams engineered to increase patterns of vortex lattices by employing zero lines of the coherent

Optics Express
|September 13, 2019
PubMed

Related Concept Videos

X-ray Diffraction09:31

X-ray Diffraction

Source: Faisal Alamgir, School of Materials Science and Engineering, Georgia Institute of Technology, Atlanta, GA
X-ray diffraction (XRD) is a technique used in materials science for determining the atomic and molecular structure of a material. This is done by irradiating a sample of the material with incident X-rays and then measuring the intensities and scattering angles of the X-rays that are scattered by the material. The intensity of the scattered X-rays are plotted as a function of the...
92.8K
Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
51.8K
Interference and Diffraction08:41

Interference and Diffraction

Source: Yong P. Chen, PhD, Department of Physics & Astronomy, College of Science, Purdue University, West Lafayette, IN
Interference and diffraction are characteristic phenomena of waves, ranging from water waves to electromagnetic waves such as light. Interference refers to the phenomenon of when two waves of the same kind overlap to give an alternating spatial variation of large and small wave amplitude. Diffraction refers to the phenomenon of when a wave passes through an aperture or...
94.6K
Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

The measurement protocol and data analysis procedure are given for obtaining transverse coherence of a synchrotron radiation X-ray source along four directions simultaneously using a single 2-D checkerboard phase grating. This simple technique can be applied for complete transverse coherence characterization of X-ray sources and X-ray...
10.1K
Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution08:41

Lensfree On-chip Tomographic Microscopy Employing Multi-angle Illumination and Pixel Super-resolution

Lensfree optical tomography is a three-dimensional microscopy technique that offers a spatial resolution of <1 μm × <1 μm × <3 μm in x, y and z dimensions, respectively, over a large imaging-volume of 15-100 mm3, which can be particularly useful for integration with lab-on-a-chip...
11.9K
Electric Field Lines01:25

Electric Field Lines

The three-dimensional representation of the electric field of a positive point charge requires tracing the electric field vectors, whose lengths decrease as the square of their distance from the charge and which point away from the charge at each point. This vector field is no doubt challenging to visualize. The visualization of electric fields becomes quickly intractable as the number of charges increases.
The solution to this problem is to use electric field lines, which are not vectors but...
9.3K