Determining the continuous thermo-optic coefficients of chalcogenide glass thin films in the MIR region using FTIR transmission spectra
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Updated: Jan 19, 2026

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
Published on: August 19, 2016
Abstract:
A new method (FTIR continuous dn / dT method, n is refractive index and T temperature) for measuring the continuous thermo-optic coefficients of thin transparent films in the mid-infrared (MIR) spectral region is introduced. The technique is based on Fourier transform infrared (FTIR) transmission spectra measured at different temperatures. It is shown that this method can successfully determine the thermo-optic coefficient of chalcogenide glass thin films (of batch compositions Ge20Sb10Se70 at. % (atomic %) and Ge16As24Se15.5Te44.5 at. %) over the wavelength range from 2 to 25 µm. The measurement precision error is less than ± 11.5 ppm / °C over the wavelength range from 6 to 20 µm. The precision is much better than that provided by the prism minimum deviation method or an improved Swanepoel method.
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